Optical, electrical and structural properties of polycrystalline β-FeSi2 thin films fabricated by electron beam evaporation of ferrosilicon
H. Katsumata*, Y. Makita, H. Takahashi, H. Shibata, Naoto Kobayashi, M. Hasegawa, S. Kimura, A. Obara, J. Tanabe, S. Uekusa
*この研究の対応する著者
研究成果: Conference contribution