Particle element and size simultaneous measurement using LIBS

Muneaki Wakamatsu; Satoshi Ikezawa; Toshitsugu Ueda

doi:10.1541/ieejsmas.127.397

Particle element and size simultaneous measurement using LIBS

Muneaki Wakamatsu^*, Satoshi Ikezawa, Toshitsugu Ueda

^*この研究の対応する著者

研究成果: Article › 査読

15 被引用数 (Scopus)

抄録

We have developed high-sensitivity in-situ measurement technology based on photons with visible to ultraviolet wavelength bands. This measurement technology builds on plasmatizing particles technology and a high-sensitivity measurement technology for measuring photons from the plasma. Thus, we have established a technology for measuring particle sizes and the constituent element content of particles with 10% accuracy.

本文言語	English
ジャーナル	IEEJ Transactions on Sensors and Micromachines
巻	127
号	9
DOI	https://doi.org/10.1541/ieejsmas.127.397
出版ステータス	Published - 2007

ASJC Scopus subject areas

電子工学および電気工学
機械工学

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10.1541/ieejsmas.127.397

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引用スタイル

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abstract = "We have developed high-sensitivity in-situ measurement technology based on photons with visible to ultraviolet wavelength bands. This measurement technology builds on plasmatizing particles technology and a high-sensitivity measurement technology for measuring photons from the plasma. Thus, we have established a technology for measuring particle sizes and the constituent element content of particles with 10% accuracy.",

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AU - Wakamatsu, Muneaki

AU - Ikezawa, Satoshi

AU - Ueda, Toshitsugu

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AB - We have developed high-sensitivity in-situ measurement technology based on photons with visible to ultraviolet wavelength bands. This measurement technology builds on plasmatizing particles technology and a high-sensitivity measurement technology for measuring photons from the plasma. Thus, we have established a technology for measuring particle sizes and the constituent element content of particles with 10% accuracy.

KW - Laser break down

KW - LIBS

KW - Particle measurement technology

KW - Time measurement

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M3 - Article

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JO - IEEJ Transactions on Sensors and Micromachines

JF - IEEJ Transactions on Sensors and Micromachines

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Particle element and size simultaneous measurement using LIBS

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ASJC Scopus subject areas

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