抄録
A pattern recognition method for phytoplanktons (dinophysis fortii and dinophysis acuminata) is presented. The concept of syntactic pattern recognition with probability is used to determine the orientation of noisy shapes. A new type of Fourier descriptor that shows good performance, particularly for open curve segments, is used for the analysis of a feature line on the plankton's contour. This method is useful for identifying toxic plankton that spoil marine culture products.
本文言語 | English |
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ホスト出版物のタイトル | Proceedings - International Conference on Pattern Recognition |
Place of Publication | New York, NY, USA |
出版社 | IEEE |
ページ | 540-542 |
ページ数 | 3 |
ISBN(印刷版) | 0818607424 |
出版ステータス | Published - 1986 |
外部発表 | はい |
ASJC Scopus subject areas
- 工学(全般)