抄録
A pattern recognition method for phytoplanktons (dinophysis fortii and dinophysis acuminata) is presented. The concept of syntactic pattern recognition with probability is used to determine the orientation of noisy shapes. A new type of Fourier descriptor that shows good performance, particularly for open curve segments, is used for the analysis of a feature line on the plankton's contour. This method is useful for identifying toxic plankton that spoil marine culture products.
| 本文言語 | English |
|---|---|
| ホスト出版物のタイトル | Proceedings - International Conference on Pattern Recognition |
| Place of Publication | New York, NY, USA |
| 出版社 | IEEE |
| ページ | 540-542 |
| ページ数 | 3 |
| ISBN（印刷版） | 0818607424 |
| 出版ステータス | Published - 1986 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 工学（全般）
UN SDG
この成果は、次の持続可能な開発目標に貢献しています
