Performance evaluation of low-noise analog front-end for semiconductor detectors

Tetsuichi Kishishita, Goro Sato, Hirokazu Ikeda, Tatsuya Kiyuna, Yoshio Mito, Tadayuki Takahashi

研究成果: Conference contribution

抜粋

We report on the recent development of a low-noise analog front-end ASIC for hard X-ray and gamma-ray detectors. The ASIC aims for the readout of strip detectors utilizing silicon and cadmium telluride (CdTe) as detector materials. Each read-out channel includes a charge-sensitive amplifier, band-pass filters and sample-and-hold circuit. It also includes a leakage current compensation circuit to accommodate to the variety of solid-state detectors. The equivalent noise level of a typical channel reached 88 e- + 8.1 e-/pF (rms) for a power consumption of 3 mW per channel. We also evaluated the ASIC performances by combining with a CdTe line sensor.

元の言語English
ホスト出版物のタイトルIEEE Nuclear Science Symposium Conference Record
ページ1700-1702
ページ数3
DOI
出版物ステータスPublished - 2009
イベント2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 - Orlando, FL
継続期間: 2009 10 252009 10 31

Other

Other2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
Orlando, FL
期間09/10/2509/10/31

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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  • これを引用

    Kishishita, T., Sato, G., Ikeda, H., Kiyuna, T., Mito, Y., & Takahashi, T. (2009). Performance evaluation of low-noise analog front-end for semiconductor detectors. : IEEE Nuclear Science Symposium Conference Record (pp. 1700-1702). [5402222] https://doi.org/10.1109/NSSMIC.2009.5402222