Performance evaluation of MOSFETs with discrete dopant distribution by one-by-one doping method

T. Shinada*, M. Hori, Y. Ono, K. Taira, A. Komatsubara, T. Tanii, T. Endoh, I. Ohdomari

*この研究の対応する著者

研究成果

1 被引用数 (Scopus)

抄録

This paper presents the fabrication and measurements of MOSFETs with various dopant distributions in the channels for investigating the impact of discrete dopant distribution on device performances. Phosphorus-ions are implanted "orderly" into the channels as well as " asymmetrically" into one side of channels both with ordered and random distribution by single-ion implanter with capability of one-by-one doping. Electrical measurements reveal that the threshold voltage (Vth) fluctuation for the ordered dopant arrays is less than for conventional random doping and the device with ordered dopant array exhibits two times the lower average value (-0.4V) of Vth shift than the random dopant distribution (-0.2V). We conclude that the observed lower value originates from the uniformity of electrostatic potential in the channel region due to the ordered distribution of dopants. We also observe deviation in subthreshold current when interchanging the source and drain terminals. The subthreshold current is always larger when the dopants are located at the drain side than at the source side for both ordered and random distribution cases. We believe that this increase in current is caused by the suppression of injection velocity degradation in the source side. Accurately controlling both the amount and the positioning of dopant atoms is critical for the advancement of extending CMOS technologies with reduced variation caused by random dopant fluctuation.

本文言語English
ホスト出版物のタイトルAlternative Lithographic Technologies II
DOI
出版ステータスPublished - 2010 6 15
イベントAlternative Lithographic Technologies II - San Jose, CA, United States
継続期間: 2010 2 232010 2 25

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
7637
ISSN(印刷版)0277-786X

Conference

ConferenceAlternative Lithographic Technologies II
国/地域United States
CitySan Jose, CA
Period10/2/2310/2/25

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学

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