Phase retrieval microscope based on photon image detection

Yusuke Nakashima, Masayuki Hattori, Shinichi Komatsu

    研究成果: Article査読

    1 被引用数 (Scopus)

    抄録

    The accuracy and sensitivity of the phase retrieval from a Fraunhofer diffraction pattern greatly depend on the dynamic range of the measured Fraunhofer diffraction pattern. In this study, a photon-imaging detector was adopted to detect higher order diffraction spots of a very weak phase grating. The phase retrieval was accomplished fairly well experimentally from the Fraunhofer diffraction intensity distribution data including up to the third-order diffraction spots to which the iterative Fourier transform algorithms were applied. The object phase distribution was retrieved with satisfactory accuracy and sensitivity. A newly introduced procedure for measuring the entire diffraction pattern with single photon-imaging detector is also described.

    本文言語English
    ページ(範囲)4809-4812
    ページ数4
    ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    41
    7 B
    出版ステータスPublished - 2002 7

    ASJC Scopus subject areas

    • 物理学および天文学(その他)

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