抜粋
We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.
| 元の言語 | English |
|---|---|
| ページ（範囲） | 491-494 |
| ページ数 | 4 |
| ジャーナル | Japanese journal of applied physics |
| 巻 | 32 |
| 発行部数 | 4 A |
| DOI | |
| 出版物ステータス | Published - 1993 4 |
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
フィンガープリント Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。
これを引用
Iwabuchi, M., Fujii, T., & Kobayashi, T. (1993). Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State. Japanese journal of applied physics, 32(4 A), 491-494. https://doi.org/10.1143/JJAP.32.L491