Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State

Mamoru Iwabuchi, Tatsuhiko Fujii, Takeshi Kobayashi

研究成果: Article査読

4 被引用数 (Scopus)

抄録

We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.

本文言語English
ページ(範囲)491-494
ページ数4
ジャーナルJapanese journal of applied physics
32
4 A
DOI
出版ステータスPublished - 1993 4
外部発表はい

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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