Photo-And Electron-Beam-Induced Currents From Epitaxial Yba2cu30j, Metal-Insulator-Superconductor (Mis) Structure In The Normal State

Mamoru Iwabuchi, Tatsuhiko Fujii, Takeshi Kobayashi

研究成果: Article

4 引用 (Scopus)

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We present the first report of observation of photoinduced and electron-beam-induced short-circuit currents across the Al/(lOO)SrTi03/(OOl)YBa2Cu3Oy metal-insulator-superconductor (MIS) structure in the normal state. Observed current flow is an indication of downward band bending of the YBa2Cu30y surface layer at the MIS interface, in accordance with the prediction by Hirano et al. based on its large work-function value (Jpn. J. Appl. Phys. 31 (1992) L1345). The electron-beam-induced current (EBIC) image revealed structural defects at the interface. From this image, diffusion length in the (00l)YBa2Cu3Oy layer was roughly estimated as 0.1 -0.2 pm.

元の言語English
ページ(範囲)491-494
ページ数4
ジャーナルJapanese journal of applied physics
32
発行部数4 A
DOI
出版物ステータスPublished - 1993 4

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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