抄録
X-ray photoelectron spectroscopy (XPS) investigations of conducting polymer polythiophene (PT)/indium tin oxide (ITO) and PT/SnO2 interfaces have been conducted. Interfacial electrochemical diffusion of the metal oxide substrate species has been observed in both cases through electrochemical reduction process. XPS investigation has focused on the core-level energies and spectral profiles of the diffused substrate species into polymer matrix. A larger part of the diffused species is metal oxides in both cases determined by measuring chemical shifts of core-levels of In Sd5/2 and Sn Sd5/2. However, increase in lower binding energy components of In Sd5/2 and Sn Sd5/2 spectra of the diffused species indicates that the diffused species in polymer matrix are a mixture of metallic and oxide states of In and Sn. Furthermore, with regard to PT backbone-originated S 2p lines, a large splitting was observed indicating the large interaction between diffused metal oxides and sulfur sites of the polymer backbone.
本文言語 | English |
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ページ(範囲) | 360-365 |
ページ数 | 6 |
ジャーナル | Applied Surface Science |
巻 | 144-145 |
号 | 0 |
出版ステータス | Published - 1999 4月 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理化学および理論化学
- 表面、皮膜および薄膜
- 凝縮系物理学