Photoemission study of the SiO2 /Si interface structure of thin oxide films on Si(100), (111), and (110) surfaces

Michio Niwano, Hitoshi Katakura, Yuki Takeda, Yuji Takakuwa, Nobuo Miyamoto, Atsushi Hiraiwa, Kunihiro Yaqi

研究成果: Article

68 引用 (Scopus)
元の言語English
ページ(範囲)195-200
ページ数6
ジャーナルJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
9
発行部数2
DOI
出版物ステータスPublished - 1991 3 1
外部発表Yes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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