PIXE and PIXE-induced XRF for chemical specification

M. Uda*, T. Yamamoto

*この研究の対応する著者

研究成果: Conference article査読

8 被引用数 (Scopus)

抄録

Wavelength dispersive X-ray spectra with fine structures in the PIXE and PIXE-induced XRF spectra have been proved to be very much useful for chemical specification of condensed matters. The fine structures have been reproduced theoretically by introducing molecular orbital calculations, the shake-off and resonant orbital rearrangement (ROR) processes, together with the direct Coulomb interaction between projectiles and target atoms, and the self-absorption of emitted X-rays through the targets. Comparison between observed and theoretical spectra is given here for F and S atoms.

本文言語English
ページ(範囲)1-7
ページ数7
ジャーナルNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
150
1-4
DOI
出版ステータスPublished - 1999 4 2
イベントProceedings of the 1998 8th International Conference on PIXE and its Analytical Applications - Lund, Swed
継続期間: 1998 6 141998 6 18

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学

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