Polarized Raman study for epitaxial PZT thick film with the mixture orientation of (100)/(001)

Mitsumasa Nakajima, Takashi Fujisawa, Ken Nishida, Takashi Yamamoto, Minoru Osada, Hiroshi Naganuma, Soichiro Okamura, Hiroshi Funakubo

研究成果: Conference contribution

4 被引用数 (Scopus)

抄録

(100)/(001)-Oriented PZT thick films were grown on SrRuO3//(100) SrTiO3 and (100) MgO substrates by matel organic chemical vapor deposition (MOCVD) with different volume fraction of (001) orientation, and were compared with (001) single-oriented epitaxial PZT thick films grown on SrRuO3//LaNiO3//(100) CaF2 by polarized Raman spectroscopy. The spectra from (100)-oriented domain and (001)-oriented domain can be individually observed for the films with the mixture orientation of (100)/(001). Raman analysis revealed the different strain state of (100)-oriented and (001)-oriented domains. Moreover, the rotation dependence of A1(1TO) mode could be explained by the calculation using the volume fraction of (001)-oriented domains obtained from X-ray reciprocal space mapping analysis for the films with the mixture orientation of (100)/(001). These results suggest the local structure characterized by Raman spectroscopy almost agreed with the structure characterized by XRD analysis for the films with the mixture orientation of (100)/(001).

本文言語English
ホスト出版物のタイトルKey Engineering Materials
ページ99-102
ページ数4
421-422
DOI
出版ステータスPublished - 2010
外部発表はい
イベント6th Asian Meeting on Electroceramics, AMEC-6, in conjunction with the Electronics Division Meeting of the Ceramic Society of Japan - Tsukuba, Japan
継続期間: 2008 10 222008 10 24

出版物シリーズ

名前Key Engineering Materials
421-422
ISSN(印刷版)10139826

Other

Other6th Asian Meeting on Electroceramics, AMEC-6, in conjunction with the Electronics Division Meeting of the Ceramic Society of Japan
CountryJapan
CityTsukuba
Period08/10/2208/10/24

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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