Possibility of a minimal purity-measurement scheme critically depends on the parity of dimension of the quantum system

T. Tanaka, G. Kimura, H. Nakazato

研究成果: Article査読

14 被引用数 (Scopus)

抄録

In this paper, we investigate the possibility of measuring the purity of a quantum state (and the overlap between two quantum states) within a minimal model where the measurement device is minimally composed. The minimality is based on the assumptions that (i) we use a yes-no measurement on a single system to determine the single value of the purity in order not to extract other redundant information and (ii) we use neither ancilla nor random measurement. We show that the measurability of the purity within this model critically depends on the parity of dimension of the quantum system: The purity measurement is possible for odd-dimensional quantum systems, while it is impossible for even-dimensional cases.

本文言語English
論文番号012303
ジャーナルPhysical Review A - Atomic, Molecular, and Optical Physics
87
1
DOI
出版ステータスPublished - 2013 1 3

ASJC Scopus subject areas

  • 原子分子物理学および光学

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