抄録
The measurement of gas pressure in ultrahigh vacuum was carried out by detecting laser-generated photoelectrons. Xenon atoms filling a vacuum chamber were nonresonantly ionized by a picosecond laser pulse. The laser intensity dependence of the number of ions produced was measured, and almost all xenon atoms in a focal area were found to be ionized. The number of photoelectrons produced was also measured as a function of xenon pressure. The signal intensity was proportional to xenon pressure in the range from 10-2 to 10-7 Pa.
本文言語 | English |
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ページ(範囲) | 714-717 |
ページ数 | 4 |
ジャーナル | Shinku/Journal of the Vacuum Society of Japan |
巻 | 37 |
号 | 9 |
DOI | |
出版ステータス | Published - 1994 |
外部発表 | はい |
ASJC Scopus subject areas
- 凝縮系物理学
- 表面、皮膜および薄膜
- 電子工学および電気工学