抄録
Profile and plan-view high resolution images of reconstructed surface structures of gold are described. Profile images are sensitive to displacements of surface atoms normal to the surfaces. They also show displacements parallel to the surface but only along one direction perpendicular to the electron beam direction. The plan-view images, on the other hand, show displacements parallel to the surfaces. Thus, the effectiveness of the two methods depends on the characteristics of the reconstruction. Profile imaging is effective for studies of the reconstructions of Au(001)5 × 28 and Au(110)2 × 1), but plan-view images are effective for studies of the reconstruction of Au(111)22 × 1. In this sense the methods are complementary.
本文言語 | English |
---|---|
ページ(範囲) | 195-203 |
ページ数 | 9 |
ジャーナル | Ultramicroscopy |
巻 | 26 |
号 | 1-2 |
DOI | |
出版ステータス | Published - 1988 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 原子分子物理学および光学
- 器械工学