抄録
Novel methods are proposed to enlarge the vertical (normal to the plane of electron orbit) width of the exposed area in synchrotron radiation (SR) lithography. They are the shaping of the cross section of the SR beam by a fixed toroidal mirror with specified parameters and the superposition of the reflected SR beams from fixed planar mirrors onto the upper and lower peripheries of the straight beam. An experimental verification is presented, and merits and demerits of these methods are compared with those of other methods.
本文言語 | English |
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ホスト出版物のタイトル | Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena |
ページ | 232-236 |
ページ数 | 5 |
巻 | 3 |
版 | 1 |
DOI | |
出版ステータス | Published - 1984 1月 |
外部発表 | はい |
イベント | Proc of the 1984 Int Symp on Electron, Ion, and Photon Beams - Tarrytown, NY, USA 継続期間: 1984 5月 29 → 1984 6月 1 |
Other
Other | Proc of the 1984 Int Symp on Electron, Ion, and Photon Beams |
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City | Tarrytown, NY, USA |
Period | 84/5/29 → 84/6/1 |
ASJC Scopus subject areas
- 工学(全般)