Radiation and polarization properties of free-exciton emission from AlN (0001) surface

Yoshitaka Taniyasu*, Makoto Kasu, Toshiki Makimoto

*この研究の対応する著者

研究成果: Article査読

55 被引用数 (Scopus)

抄録

Free-exciton emission from AlN (0001) surface was characterized by angle-dependent photoluminescence (PL) measurement. As the radiation direction was inclined from the surface normal (c -axis direction), the emission intensity increased. This is because the optical transition between the conduction band and the top valence band is mainly allowed for light with the electric field parallel to the c -axis direction of AlN (E∥c) and consequently the free-exciton emission is strongly polarized for E∥c. By analyzing the angle-dependent PL intensities, the polarization ratio was estimated to be 0.995. This high polarization ratio results from the large negative crystal-field splitting energy.

本文言語English
論文番号261911
ジャーナルApplied Physics Letters
90
26
DOI
出版ステータスPublished - 2007
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

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