Radiation effects and surface deformation of silica by ion microbeam

H. Nishikawa*, T. Souno, M. Hattori, Y. Nishihara, Y. Ohki, E. Watanabe, M. Oikawa, T. Kamiya, K. Arakawa

*この研究の対応する著者

研究成果: Article査読

3 被引用数 (Scopus)

抄録

Radiation effects induced by ion microbeam were studied by a confocal microspectroscopy and an atomic force microscopy (AFM). We investigate two significant radiation effects, defect generation and compaction, which were ascribed to electronic (Eelec) and nuclear stopping powers (Enucl), respectively. Photoluminescence mapping of nonbridging oxygen hole centers at 650 nm reveals the defect formation along the tracks of ions. The surface deformation measured by AFM depends on the width of irradiated by microbeam. Confinement effects from the interface of irradiated and nonirradiated regions are taken into account for the understanding of the correlation between the surface deformations and internal compactions.

本文言語English
ページ(範囲)342-345
ページ数4
ジャーナルNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
191
1-4
DOI
出版ステータスPublished - 2002 5月
外部発表はい

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 器械工学

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