We constructed a parallel plate drift chamber for measuring the ratio of the transverse diffusion coefficient Dt to the mobility μ of electrons multiplied by the elementary charge e, eDt/μ, which is called the transverse characteristic energy, in high-pressure xenon gas. The characteristic energies of electrons in Xe were obtained at a high pressure of 1.0MPa and the reduced electric field, E/N, from 0.77 to 7.7 × 10 -18 V·Cm2, where E denotes an electric field and N the number density of Xe atoms. At the same E/N, our results agreed well with the data at pressures from 107 to 193 kPa previously obtained by Koizumi et al. [J. Phys. B 19 (1986) 2331]. The characteristic energies of electrons in Xe were found to be constant as a function of E/N from a low pressure to 1.0MPa.
|ジャーナル||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|出版ステータス||Published - 2004 8月|
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