Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon

Shingo Kobayashi*, Nobuyuki Hasebe, Tsutomu Igarashi, Takashi Miyachi, Mitsuhiro Miyajima, Hiroyuki Okada, Tadayoshi Doke, Eido Shibamura, Valery V. Dmitrenko, Konstantin F. Vlasik

*この研究の対応する著者

    研究成果: Article査読

    14 被引用数 (Scopus)

    抄録

    We constructed a parallel plate drift chamber for measuring the ratio of the transverse diffusion coefficient Dt to the mobility μ of electrons multiplied by the elementary charge e, eDt/μ, which is called the transverse characteristic energy, in high-pressure xenon gas. The characteristic energies of electrons in Xe were obtained at a high pressure of 1.0MPa and the reduced electric field, E/N, from 0.77 to 7.7 × 10 -18 V·Cm2, where E denotes an electric field and N the number density of Xe atoms. At the same E/N, our results agreed well with the data at pressures from 107 to 193 kPa previously obtained by Koizumi et al. [J. Phys. B 19 (1986) 2331]. The characteristic energies of electrons in Xe were found to be constant as a function of E/N from a low pressure to 1.0MPa.

    本文言語English
    ページ(範囲)5568-5572
    ページ数5
    ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    43
    8 A
    DOI
    出版ステータスPublished - 2004 8 1

    ASJC Scopus subject areas

    • 工学(全般)
    • 物理学および天文学(全般)

    フィンガープリント

    「Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    引用スタイル