TY - JOUR
T1 - Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media
AU - Tsuboi, S.
AU - Matsutera, H.
AU - Ishi, T.
AU - Ishiwata, N.
AU - Ohashi, K.
PY - 2001/10
Y1 - 2001/10
N2 - The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.
AB - The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.
KW - Co-Ni-Fe head
KW - Focused-ion-beam
KW - Perpendicular magnetic recording
KW - Pole thickness
KW - Recording head
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U2 - 10.1016/S0304-8853(01)00384-5
DO - 10.1016/S0304-8853(01)00384-5
M3 - Conference article
AN - SCOPUS:0035477433
VL - 235
SP - 375
EP - 381
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
SN - 0304-8853
IS - 1-3
T2 - Proceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000)
Y2 - 23 October 2000 through 26 October 2000
ER -