Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media

S. Tsuboi, H. Matsutera, T. Ishi, N. Ishiwata, K. Ohashi

研究成果: Conference article査読

1 被引用数 (Scopus)

抄録

The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.

本文言語English
ページ(範囲)375-381
ページ数7
ジャーナルJournal of Magnetism and Magnetic Materials
235
1-3
DOI
出版ステータスPublished - 2001 10
外部発表はい
イベントProceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) - Sendai, Japan
継続期間: 2000 10 232000 10 26

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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