Reduce test cost by reusing test oracles through combinatorial join

Hiroshi Ukai, Xiao Qu, Hironori Washizaki, Yoshiaki Fukazawa

研究成果: Conference contribution

抄録

Methods to generate combinatorial test suites have been extensively studied in the combinatorial interaction testing (CIT) community, but the creation of test oracles for the test cases remains a challenging and expensive task because they are created manually. In this paper, we propose a novel technique to 'join' multiple test suites into one while satisfying the required combinatorial coverage of the system under test. This technique allows test oracles designed and created in earlier testing phases to be reused in later ones. Our study results indicate that the technique can reduce the total test cost to design and execute a test suite by more than 55% compared to the conventional testing approach.

本文言語English
ホスト出版物のタイトルProceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019
出版社Institute of Electrical and Electronics Engineers Inc.
ページ260-263
ページ数4
ISBN(電子版)9781728108889
DOI
出版ステータスPublished - 2019 4
イベント12th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019 - Xi'an, China
継続期間: 2019 4 222019 4 27

出版物シリーズ

名前Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019

Conference

Conference12th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2019
国/地域China
CityXi'an
Period19/4/2219/4/27

ASJC Scopus subject areas

  • ソフトウェア
  • 安全性、リスク、信頼性、品質管理

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