This paper presents a new test data compression technique for multiscan-based designs through dictionary-based encoding on the single or sequences scan-inputs. In spite of its simplicity, it achieves significant reduction in test data volume. Unlike some previous approaches on test data compression, our approach eliminates the need for additional synchronization and handshaking between the CUT and the ATE, so it is especially suitable to be integrated in a low cost test scheme for SoC test In addition in contrast to previous dictionary-based coding techniques, even for the CUT with a small number of scan chains, the proposed approach can achieve satisfied reduction in test data volume. Experimental results showed the proposed test scheme works particularly well for the large ISCAS'89 benchmarks.
|ジャーナル||Midwest Symposium on Circuits and Systems|
|出版ステータス||Published - 2004 12月 1|
|イベント||The 2004 47th Midwest Symposium on Circuits and Systems - Conference Proceedings - Hiroshima, Japan|
継続期間: 2004 7月 25 → 2004 7月 28
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