Reentrant phase transition of Ba2NaNb5O15

K. Fujishiro*, Y. Uesu, S. Mori, N. Yamamoto, Y. Koyama

*この研究の対応する著者

研究成果: Article査読

抄録

Precise measurements of the temperature dependence of birefringence Δn, lattice strain X12 and of X-ray profiles from 4 K (in an optical study) or from 20 K (in an X-ray study) to 550 K were made, special attention being paid to the low temperature phase transition at 110 K (TL). Δn and X12 manifested clear temperature hysteresis at TL, but did not vanish below it. However when the specimen was kept at 77 K during 48 hours, in decreased to zero. These results, together with TEM observation of the appearance of microdomains, revealed that the low temperature phase is tetragonal as has been reported 1), but is obtained only after a quite long relaxation time.

本文言語English
ページ(範囲)123-126
ページ数4
ジャーナルFerroelectrics
185
1-4
DOI
出版ステータスPublished - 1996 1 1

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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