Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces

H. Sasaki, M. Aoki, H. Kawarada

研究成果: Article

21 引用 (Scopus)

抜粋

Reflection electron microscopy (REM) and scanning tunneling microscopy have been applied to the estimation of the surface flatness of diamond (001) surfaces and to the 2 × 1 reconstructed structure. The macroscopic surface flatness observed by REM has been improved by using CO as a source gas and by boron-doping.

元の言語English
ページ(範囲)1271-1276
ページ数6
ジャーナルDiamond and Related Materials
2
発行部数9
DOI
出版物ステータスPublished - 1993 7 1

    フィンガープリント

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Mechanical Engineering
  • Materials Chemistry
  • Electrical and Electronic Engineering

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