抜粋
Reflection electron microscopy (REM) and scanning tunneling microscopy have been applied to the estimation of the surface flatness of diamond (001) surfaces and to the 2 × 1 reconstructed structure. The macroscopic surface flatness observed by REM has been improved by using CO as a source gas and by boron-doping.
| 元の言語 | English |
|---|---|
| ページ（範囲） | 1271-1276 |
| ページ数 | 6 |
| ジャーナル | Diamond and Related Materials |
| 巻 | 2 |
| 発行部数 | 9 |
| DOI | |
| 出版物ステータス | Published - 1993 7 1 |
フィンガープリント
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Chemistry(all)
- Mechanical Engineering
- Materials Chemistry
- Electrical and Electronic Engineering
これを引用
Sasaki, H., Aoki, M., & Kawarada, H. (1993). Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces. Diamond and Related Materials, 2(9), 1271-1276. https://doi.org/10.1016/0925-9635(93)90007-O