抜粋
The use of a double-layer dielectric film (SiO//2/Si//3N//4) on poly-Si is proposed as a way to achieve the reduced thickness films needed to scale down VLSIs. The oxidation of Si//3N//4 reduces leakage current and defect density. It is shown that a double-layer film with a thinner top oxide layer is harder to break down, so, the thickness of the top oxide layer must be reduced in order to increase the reliability of double-layer dielectrics. Moreover, there are no edge effects on the reliability of double-layer dielectric films due to the patterned poly-Si electrode. These results, confirm that SiO//2/Si//3N//4 is a highly reliable nanometer-thick dielectric for use on poly-Si.
| 元の言語 | English |
|---|---|
| ホスト出版物のタイトル | Annual Proceedings - Reliability Physics (Symposium) |
| 出版者 | IEEE |
| ページ | 55-59 |
| ページ数 | 5 |
| 出版物ステータス | Published - 1987 |
| 外部発表 | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
フィンガープリント RELIABILITY OF NANO-METER THICK MULTI-LAYER DIELECTRIC FILMS ON POLY-CRYSTALLINE SILICON.' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。
これを引用
Ohji, Y., Kusaka, T., Yoshida, I., Hiraiwa, A., Yagi, K., Mukai, K., & Kasahara, O. (1987). RELIABILITY OF NANO-METER THICK MULTI-LAYER DIELECTRIC FILMS ON POLY-CRYSTALLINE SILICON. ： Annual Proceedings - Reliability Physics (Symposium) (pp. 55-59). IEEE.