Remaining service life diagnostic technology of phenol insulators for power distribution equipment

S. Miki, T. Hasegawa, S. Umemura, H. Okazawa, Y. Otsuka, Hiroshi Inujima

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

We have applied a remaining service life diagnostic technology to phenol insulators of power distribution equipment. Application of chemical evaluation and the Mahalanobis-Taguchi (MT) method enabled us to diagnose the insulators' degree of deterioration with great accuracy and nondestructively on-site. Time was defined as the end of service life when electrical discharge was initiated and a remaining service life was presumed from the diagnostic results by the MT method and the year in which the master curve of service life and the threshold value intersect. Surface resistivity (threshold value) for electrical discharge initiation can be calculated from creepage distance, permittivity, frequency, etc.. It was clarified that a remaining service life for phenol insulators could be presumed by this technology because there was a good relationship between the check examination results of electric discharge initiation in the laboratory and the presumption results.

元の言語English
ホスト出版物のタイトルAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
ページ41-44
ページ数4
DOI
出版物ステータスPublished - 2007
イベント2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Vancouver, BC, Canada
継続期間: 2007 10 142007 10 19

Other

Other2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Canada
Vancouver, BC
期間07/10/1407/10/19

    フィンガープリント

ASJC Scopus subject areas

  • Engineering(all)
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

これを引用

Miki, S., Hasegawa, T., Umemura, S., Okazawa, H., Otsuka, Y., & Inujima, H. (2007). Remaining service life diagnostic technology of phenol insulators for power distribution equipment. : Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP (pp. 41-44). [4451467] https://doi.org/10.1109/CEIDP.2007.4451467