Remaining service life diagnostic technology of phenol insulators for power distribution equipment

S. Miki*, T. Hasegawa, S. Umemura, H. Okazawa, Y. Otsuka, H. Inujima

*この研究の対応する著者

研究成果: Conference article査読

1 被引用数 (Scopus)

抄録

We have applied a remaining service life diagnostic technology to phenol insulators of power distribution equipment. Application of chemical evaluation and the Mahalanobis-Taguchi (MT) method enabled us to diagnose the insulators' degree of deterioration with great accuracy and nondestructively on-site. Time was defined as the end of service life when electrical discharge was initiated and a remaining service life was presumed from the diagnostic results by the MT method and the year in which the master curve of service life and the threshold value intersect. Surface resistivity (threshold value) for electrical discharge initiation can be calculated from creepage distance, permittivity, frequency, etc.. It was clarified that a remaining service life for phenol insulators could be presumed by this technology because there was a good relationship between the check examination results of electric discharge initiation in the laboratory and the presumption results.

本文言語English
論文番号4451467
ページ(範囲)41-44
ページ数4
ジャーナルAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
DOI
出版ステータスPublished - 2007 12 1
イベント2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Vancouver, BC, Canada
継続期間: 2007 10 142007 10 19

ASJC Scopus subject areas

  • 工学(全般)
  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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