Residual stress distribution in oxide films formed on Zircaloy-2

T. Sawabe*, T. Sonoda, Masahiro Furuya, S. Kitajima, H. Takano

*この研究の対応する著者

研究成果: Article査読

3 被引用数 (Scopus)

抄録

In order to evaluate residual the stress distribution in oxides formed on zirconium alloys, synchrotron X-ray diffraction (XRD) was performed on the oxides formed on Zircaloy-2 after autoclave treatment at a temperature of 360° C in pure water. The use of a micro-beam XRD and a micro-sized cross-sectional sample achieved the detailed local characterization of the oxides. The oxide microstructure was observed by TEM following the micro-beam XRD measurements. The residual compressive stress increased in the vicinity of the oxide/metal interface of the pre-transition oxide. Highly oriented columnar grains of a monoclinic phase were observed in that region. Furthermore, at the interface of the post-first transition oxide, there was only a small increase in the residual compressive stress and the columnar grains had a more random orientation. The volume fraction of the tetragonal phase increased with the residual compressive stress. The results are discussed in terms of the formation and transition of the protective oxide.

本文言語English
ページ(範囲)658-665
ページ数8
ジャーナルJournal of Nuclear Materials
466
DOI
出版ステータスPublished - 2015 11 1
外部発表はい

ASJC Scopus subject areas

  • 核物理学および高エネルギー物理学
  • 原子力エネルギーおよび原子力工学
  • 材料科学(全般)

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