Robust registration of serial cell microscopic images using 3D Hilbert scan search

Yongwen Lai, Seiichiro Kamata, Zhizhong Fu

研究成果: Conference contribution

抜粋

Microscopic images are quite helpful for us to observe the details of cells because of its high resolution. Furthermore it can benefit biologists and doctors to view the cell structure from any aspect by using a serial images to generate 3D cell structure. However each cell slice is placed at the microscopy respectively, which will bring in the arbitrary rotation and translation among the serial slices. What's more, the sectioning process will destroy the cell structure such as tearing or warping. Therefore we must register the serial slices before rendering the volume data in 3D. In this paper we propose a robust registration algorithm based on an improved 3D Hilbert scam search. Besides we put forward a simple but effective method to remove false matching in consecutive images. Finally we correct the local deformation based on optical-flow theory and adopt multi-resolution method. Our algorithm is tested, on a serial microscopy kidney cell images, and the experimental results show how accurate and robust of our method is.

元の言語English
ホスト出版物のタイトルProceedings of the 15th IAPR International Conference on Machine Vision Applications, MVA 2017
出版者Institute of Electrical and Electronics Engineers Inc.
ページ530-533
ページ数4
ISBN(電子版)9784901122160
DOI
出版物ステータスPublished - 2017 7 19
イベント15th IAPR International Conference on Machine Vision Applications, MVA 2017 - Nagoya, Japan
継続期間: 2017 5 82017 5 12

Other

Other15th IAPR International Conference on Machine Vision Applications, MVA 2017
Japan
Nagoya
期間17/5/817/5/12

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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  • これを引用

    Lai, Y., Kamata, S., & Fu, Z. (2017). Robust registration of serial cell microscopic images using 3D Hilbert scan search. : Proceedings of the 15th IAPR International Conference on Machine Vision Applications, MVA 2017 (pp. 530-533). [7986917] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/MVA.2017.7986917