Robust secure scan design against scan-based differential cryptanalysis

    研究成果: Article

    19 引用 (Scopus)

    抄録

    Scan technology carries the potential risk of being misused as a side channel to leak out the secrets of crypto cores. The existing scan-based attacks could be viewed as one kind of differential cryptanalysis, which takes advantages of scan chains to observe the bit changes between pairs of chosen plaintexts so as to identify the secret keys. To address such a design/test challenge, this paper proposes a robust secure scan structure design for crypto cores as a countermeasure against scan-based attacks to maintain high security without compromising the testability.

    元の言語English
    記事番号5734887
    ページ(範囲)176-181
    ページ数6
    ジャーナルIEEE Transactions on Very Large Scale Integration (VLSI) Systems
    20
    発行部数1
    DOI
    出版物ステータスPublished - 2012 1

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Hardware and Architecture
    • Software

    これを引用

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    title = "Robust secure scan design against scan-based differential cryptanalysis",
    abstract = "Scan technology carries the potential risk of being misused as a side channel to leak out the secrets of crypto cores. The existing scan-based attacks could be viewed as one kind of differential cryptanalysis, which takes advantages of scan chains to observe the bit changes between pairs of chosen plaintexts so as to identify the secret keys. To address such a design/test challenge, this paper proposes a robust secure scan structure design for crypto cores as a countermeasure against scan-based attacks to maintain high security without compromising the testability.",
    keywords = "Crypto hardware, Differential cryptanalysis, Scan-based discrete Fourier transform (DFT), Security, Side channel attack, Testability",
    author = "Youhua Shi and Nozomu Togawa and Masao Yanagisawa and Tatsuo Ohtsuki",
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    AU - Yanagisawa, Masao

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    KW - Differential cryptanalysis

    KW - Scan-based discrete Fourier transform (DFT)

    KW - Security

    KW - Side channel attack

    KW - Testability

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