Scan-based attack against des cryptosystems using scan signatures

Hirokazu Kodera, M. Yanagisawa, Nozomu Togawa

研究成果: Conference contribution

15 引用 (Scopus)

抜粋

With the high integration of LSI in recent years, the importance of design-for-techniques has been increasing. A scan-path test is one of the useful design-for-test techniques, in which testers can observe and control registers inside the target LSI chip directly. On the other hand, the risk of side-channel attacks against cryptographic LSIs and modules has been pointed out. In particular, scan-based attacks which retrieve secret keys by analyzing scan data obtained from scan chains has been attracting attention. In this paper, we propose a scan-based attack method against DES using scan signatures. Our proposed method are based on focusing on particular bit-column-data in a set of scan data and observing their changes when given several plaintexts. We can retrieve secret keys by partitioning the S-BOX process into eight independent sub-processes and reducing the number of the round key candidates from 2 48 to 26×8 = 512. Our proposed methods can retrieve secret keys even if a scan chain includes registers except a crypto module and attackers do not know when the encryption is really done in the crypto module. Experimental results demonstrate that we successfully retrieve the secret keys of a DES cryptosystem using at most 32 plaintexts.

元の言語English
ホスト出版物のタイトル2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012
ページ599-602
ページ数4
DOI
出版物ステータスPublished - 2012 12 1
イベント2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012 - Kaohsiung, Taiwan, Province of China
継続期間: 2012 12 22012 12 5

出版物シリーズ

名前IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Conference

Conference2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012
Taiwan, Province of China
Kaohsiung
期間12/12/212/12/5

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • これを引用

    Kodera, H., Yanagisawa, M., & Togawa, N. (2012). Scan-based attack against des cryptosystems using scan signatures. : 2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2012 (pp. 599-602). [6419106] (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS). https://doi.org/10.1109/APCCAS.2012.6419106