Scintillation yield in high pressure xenon and xenon doped with methane

K. N. Pushkin, Nobuyuki Hasebe, S. Kobayashi, C. Tezuka, M. Mimura, T. Hosojima, M. N. Kobayashi, T. Doke, M. Miyajima, T. Miyachi, E. Shibamura, S. E. Ulin, V. V. Dmitrenko

    研究成果: Conference contribution

    4 引用 (Scopus)

    抜粋

    Scintillation light and formation yields in pure xenon and xenon doped with various concentration of methane (0.2-2%) have been measured as a function of the reduced electric field (E/N) from 0 to 4×10 -18Vcm 2 at a pressure of 2.6 MPa. The measurements of photons and electrons have been made in gaseous xenon excited by 241Am alpha particles. High purity xenon was used to fill a high-pressure xenon chamber equipped with MgF 2 window coupled to a photomultiplier tube (PMT). The scintillation light in xenon-methane mixture is observed to decrease as the concentration of methane increases.

    元の言語English
    ホスト出版物のタイトルIEEE Nuclear Science Symposium Conference Record
    編集者J.A. Seibert
    ページ550-553
    ページ数4
    1
    出版物ステータスPublished - 2004
    イベント2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors - Rome, Italy
    継続期間: 2004 10 162004 10 22

    Other

    Other2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors
    Italy
    Rome
    期間04/10/1604/10/22

    ASJC Scopus subject areas

    • Computer Vision and Pattern Recognition
    • Industrial and Manufacturing Engineering

    フィンガープリント Scintillation yield in high pressure xenon and xenon doped with methane' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Pushkin, K. N., Hasebe, N., Kobayashi, S., Tezuka, C., Mimura, M., Hosojima, T., Kobayashi, M. N., Doke, T., Miyajima, M., Miyachi, T., Shibamura, E., Ulin, S. E., & Dmitrenko, V. V. (2004). Scintillation yield in high pressure xenon and xenon doped with methane. : J. A. Seibert (版), IEEE Nuclear Science Symposium Conference Record (巻 1, pp. 550-553)