Secure scan design using improved random order and its evaluations

Masaru Oya, Yuta Atobe, Youhua Shi, Masao Yanagisawa, Nozomu Togawa

研究成果: Conference contribution

4 被引用数 (Scopus)

抄録

Scan test using scan chains is one of the most important DFT techniques. However, scan-based attacks are reported which can retrieve the secret key in crypto circuits by using scan chains. Secure scan architecture is strongly required to protect scan chains from scan-based attacks. This paper proposes an improved version of random order as a secure scan architecture. In improved random order, a scan chain is partitioned into multiple sub-chains. The structure of the scan chain changes dynamically by selecting a subchain to scan out. Testability and security of the proposed improved random order are also discussed in the paper, and the implementation results demonstrate the effectiveness of the proposed method.

本文言語English
ホスト出版物のタイトル2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014
出版社Institute of Electrical and Electronics Engineers Inc.
ページ555-558
ページ数4
February
ISBN(電子版)9781479952304
DOI
出版ステータスPublished - 2015 2 5
イベント2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014 - Ishigaki Island, Okinawa, Japan
継続期間: 2014 11 172014 11 20

出版物シリーズ

名前IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
番号February
2015-February

Other

Other2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014
CountryJapan
CityIshigaki Island, Okinawa
Period14/11/1714/11/20

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

フィンガープリント 「Secure scan design using improved random order and its evaluations」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル