Secure scan design with dynamically configurable connection

研究成果: Conference contribution

19 被引用数 (Scopus)

抄録

Scan test is a powerful test technique which can control and observe the internal states of the circuit under test through scan chains. However, it has been reported that it's possible to retrieve secret keys from cryptographic LSIs through scan chains. Therefore new secure test methods are required to satisfy both testability and security requirements. In this paper, a secure scan design is proposed to achieve adequate security requirement as a countermeasure against scan-based attacks, while still maintain high testability like normal scan testing. In our method, the internal scan chain is divided into several sub chains, and the connection order of sub chains can be dynamically changed. In addition, how to decide the connection order of those sub chains so that it can't be identified by an attacker is also proposed in this paper. The proposed method is implemented on an AES circuit to show its effectiveness, and a security analysis is also given to show how the proposed approach can be used as a countermeasure against those known scan-based attacks.

本文言語English
ホスト出版物のタイトルProceedings - 2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing, PRDC 2013
出版社IEEE Computer Society
ページ256-262
ページ数7
ISBN(印刷版)9780769551302
DOI
出版ステータスPublished - 2013 1 1
イベント19th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2013 - Vancouver, BC, Canada
継続期間: 2013 12 22013 12 4

出版物シリーズ

名前Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC
ISSN(印刷版)1541-0110

Conference

Conference19th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2013
国/地域Canada
CityVancouver, BC
Period13/12/213/12/4

ASJC Scopus subject areas

  • 計算理論と計算数学
  • コンピュータ サイエンスの応用
  • ハードウェアとアーキテクチャ
  • ソフトウェア

フィンガープリント

「Secure scan design with dynamically configurable connection」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル