Si - O - Si strained bond and paramagnetic defect centers induced by mechanical fracturing in amorphous SiO2
Shuji Munekuni, Nobuyuki Dohguchi, Hiroyuki Nishikawa, Yoshimichi Ohki, Kaya Nagasawa, Yoshimasa Hama
研究成果: Article › 査読
24
被引用数
(Scopus)