Simulation of thermal-neutron-induced single-event upset using particle and heavy-ion transport code system

Yutaka Arita, Koji Niita, Yuji Kihara, Junich Mitsuhasi, Mikio Takai, Izumi Ogawa, Tadafumi Kishimoto, Tsutomu Yoshihara

    研究成果: Article査読

    抄録

    The simulation of a thermal-neutron-induced single-event upset (SEU) was performed on a 0.4-μm-design-rule 4 Mbit static random access memory (SRAM) using particle and heavy-ion transport code system (PHITS). The SEU rates obtained by the simulation were in very good agreement with the result of experiments. PHITS is a useful tool for simulating SEUs in semiconductor devices. To further improve the accuracy of the simulation, additional methods for tallying the energy deposition are required for PHITS.

    本文言語English
    ページ(範囲)3377-3379
    ページ数3
    ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    46
    6 A
    DOI
    出版ステータスPublished - 2007 6 6

    ASJC Scopus subject areas

    • 物理学および天文学(その他)

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