Single-atom coherent field electron emitters for practical application to electron microscopy: Buildup controllability, self-repairing function and demountable characteristic

E. Rokuta*, T. Itagaki, T. Ishikawa, B. L. Cho, H. S. Kuo, T. T. Tsong, C. Oshima

*この研究の対応する著者

研究成果: Article査読

33 被引用数 (Scopus)

抄録

We have fabricated single-atom field emission (FE) tips by annealing Rh-deposited W tips at 900 K, and the FE characteristics were investigated. Due to the formation of the nanotips, the electron beams were confined in a semi-cone angle of 3°, an indication quite different from the conventional FE beams. In repairing-function test where the FE nanotips were intentionally destroyed beforehand, they recovered the peculiar FE characteristics by means of feasible low temperature annealing. Finally, we found that the present nanotips equipped the capability of recovering the unique FE properties even after an exposure to the air. These characteristics are significantly relevant to the practical applications to electron-optics instruments.

本文言語English
ページ(範囲)3686-3691
ページ数6
ジャーナルApplied Surface Science
252
10
DOI
出版ステータスPublished - 2006 3月 15

ASJC Scopus subject areas

  • 物理化学および理論化学
  • 表面、皮膜および薄膜
  • 凝縮系物理学

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