Bismuth-based-layer-structured ferroelectric films have been formed epitaxially on Nb-doped SrTiO3 substrates by pulsed laser deposition (PLD). These films show an atomically smooth surface with a wide terrace of 100 nm-200 nm, as observed by atomic force microscopy (AFM) which is ideal for measuring such properties. Thin films of (Bi0.7, Ba0.3) (Fe0.7, Ti0.3)O3 exhibit both ferroelectric and ferromagnetic (weak ferromagnetism) properties at room temperature. In these samples, a size effect is discussed at the same time.
|ジャーナル||Materials Research Society Symposium - Proceedings|
|出版ステータス||Published - 1999|
|イベント||Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA|
継続期間: 1998 11月 30 → 1998 12月 3
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