SOBINMF for automatic removal of ocular artifacts from the EEG

Hirohisa Tsubakida, Yumie Ono, Atsushi Ishiyama

    研究成果: Article査読

    抄録

    This paper introduces a novel method to automatically remove electro-oculogram (EOG) from electroencephalogram (EEG) using second-order blind identification (SOBI) and nonnegative matrix factorization (NMF). To demonstrate the effectiveness of the proposed method, we applied SOBI, NMF, or combined SOBI and NMF (SOBINMF) to the EEG data during motor imagery task in which participants imagined moving their left or right hand. Ocular artifacts were removed more effectively in our proposed SOBINMF method compared to SOBI or NMF alone.

    本文言語English
    ページ(範囲)954-962
    ページ数9
    ジャーナルIEEJ Transactions on Electronics, Information and Systems
    135
    8
    DOI
    出版ステータスPublished - 2015 8 1

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    フィンガープリント 「SOBINMF for automatic removal of ocular artifacts from the EEG」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

    引用スタイル