Analytical and experimental studies are conducted on the soft errors of 64-Kbit dynamic RAMs. First, the relation between the device parameters and the critical charge is examined. If the charge distribution collected in the silicon substrate is Gaussian, the soft error rate is expressed as a complementary error function of the critical charge.
|ジャーナル||Electronics & communications in Japan|
|出版ステータス||Published - 1981 8月|
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