Soft X-ray emission spectra of argon atoms doped in solid matrices

Yasuji Muramatsu, Tomoyuki Yamamoto, Jonathan D. Denlinger, Rupert C C Perera

研究成果: Article

1 引用 (Scopus)

抄録

Soft X-ray emission spectra in the Ar L region of various solid substrates doped with Ar atoms were measured to investigate the chemical states of the Ar atoms in the solid matrices. Ar ions were implanted into the solid matrices of Si(1 1 1), SiO2, highly oriented pyrolytic graphite (HOPG), Ti, Cr, Ni, and Cu with an acceleration voltage of 5 kV at room temperature. Soft X-ray emission spectra in the Ar L region were measured using synchrotron radiation. Low-energy tailing was observed at the L3-M1 and L 2-M1 X-ray emission peaks in Ar-doped transition metals. The density of states (DOS) of the Ar 3s orbitals indicated that the low-energy tailed DOS can be formed by hybridization with 3d orbitals in the overpressurized Ar clusters.

元の言語English
ページ(範囲)799-802
ページ数4
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
144-147
DOI
出版物ステータスPublished - 2005 6
外部発表Yes

Fingerprint

Argon
emission spectra
argon
X rays
Atoms
matrices
atoms
orbitals
x rays
Graphite
pyrolytic graphite
Tailings
Synchrotron radiation
Transition metals
synchrotron radiation
flux density
transition metals
Ions
Electric potential
electric potential

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

これを引用

Soft X-ray emission spectra of argon atoms doped in solid matrices. / Muramatsu, Yasuji; Yamamoto, Tomoyuki; Denlinger, Jonathan D.; Perera, Rupert C C.

:: Journal of Electron Spectroscopy and Related Phenomena, 巻 144-147, 06.2005, p. 799-802.

研究成果: Article

Muramatsu, Yasuji ; Yamamoto, Tomoyuki ; Denlinger, Jonathan D. ; Perera, Rupert C C. / Soft X-ray emission spectra of argon atoms doped in solid matrices. :: Journal of Electron Spectroscopy and Related Phenomena. 2005 ; 巻 144-147. pp. 799-802.
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abstract = "Soft X-ray emission spectra in the Ar L region of various solid substrates doped with Ar atoms were measured to investigate the chemical states of the Ar atoms in the solid matrices. Ar ions were implanted into the solid matrices of Si(1 1 1), SiO2, highly oriented pyrolytic graphite (HOPG), Ti, Cr, Ni, and Cu with an acceleration voltage of 5 kV at room temperature. Soft X-ray emission spectra in the Ar L region were measured using synchrotron radiation. Low-energy tailing was observed at the L3-M1 and L 2-M1 X-ray emission peaks in Ar-doped transition metals. The density of states (DOS) of the Ar 3s orbitals indicated that the low-energy tailed DOS can be formed by hybridization with 3d orbitals in the overpressurized Ar clusters.",
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T1 - Soft X-ray emission spectra of argon atoms doped in solid matrices

AU - Muramatsu, Yasuji

AU - Yamamoto, Tomoyuki

AU - Denlinger, Jonathan D.

AU - Perera, Rupert C C

PY - 2005/6

Y1 - 2005/6

N2 - Soft X-ray emission spectra in the Ar L region of various solid substrates doped with Ar atoms were measured to investigate the chemical states of the Ar atoms in the solid matrices. Ar ions were implanted into the solid matrices of Si(1 1 1), SiO2, highly oriented pyrolytic graphite (HOPG), Ti, Cr, Ni, and Cu with an acceleration voltage of 5 kV at room temperature. Soft X-ray emission spectra in the Ar L region were measured using synchrotron radiation. Low-energy tailing was observed at the L3-M1 and L 2-M1 X-ray emission peaks in Ar-doped transition metals. The density of states (DOS) of the Ar 3s orbitals indicated that the low-energy tailed DOS can be formed by hybridization with 3d orbitals in the overpressurized Ar clusters.

AB - Soft X-ray emission spectra in the Ar L region of various solid substrates doped with Ar atoms were measured to investigate the chemical states of the Ar atoms in the solid matrices. Ar ions were implanted into the solid matrices of Si(1 1 1), SiO2, highly oriented pyrolytic graphite (HOPG), Ti, Cr, Ni, and Cu with an acceleration voltage of 5 kV at room temperature. Soft X-ray emission spectra in the Ar L region were measured using synchrotron radiation. Low-energy tailing was observed at the L3-M1 and L 2-M1 X-ray emission peaks in Ar-doped transition metals. The density of states (DOS) of the Ar 3s orbitals indicated that the low-energy tailed DOS can be formed by hybridization with 3d orbitals in the overpressurized Ar clusters.

KW - Argon

KW - Soft X-ray

KW - Synchrotron radiation

KW - X-ray emission

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