Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

    研究成果: Conference contribution

    1 被引用数 (Scopus)

    抄録

    Soft X-ray exposure effects on CH3NH3PbI3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PbI3 to PbI2 due to evaporation of methylammonium iodide.

    本文言語English
    ホスト出版物のタイトル2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
    出版社Institute of Electrical and Electronics Engineers Inc.
    ページ1657-1660
    ページ数4
    2016-November
    ISBN(電子版)9781509027248
    DOI
    出版ステータスPublished - 2016 11 18
    イベント43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
    継続期間: 2016 6 52016 6 10

    Other

    Other43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
    CountryUnited States
    CityPortland
    Period16/6/516/6/10

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering
    • Electrical and Electronic Engineering

    フィンガープリント 「Soft X-ray irradiation effect on surface structure of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> perovskite in multi-film stack device」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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