抄録
Soft X-ray exposure effects on CH3NH3PbI3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PbI3 to PbI2 due to evaporation of methylammonium iodide.
本文言語 | English |
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ホスト出版物のタイトル | 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 |
出版社 | Institute of Electrical and Electronics Engineers Inc. |
ページ | 1657-1660 |
ページ数 | 4 |
巻 | 2016-November |
ISBN(電子版) | 9781509027248 |
DOI | |
出版ステータス | Published - 2016 11月 18 |
イベント | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States 継続期間: 2016 6月 5 → 2016 6月 10 |
Other
Other | 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 |
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国/地域 | United States |
City | Portland |
Period | 16/6/5 → 16/6/10 |
ASJC Scopus subject areas
- 制御およびシステム工学
- 産業および生産工学
- 電子工学および電気工学