Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

研究成果: Conference contribution

抄録

Soft X-ray exposure effects on CH3NH3PM3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PM3 to PbI2 due to evaporation of methylammonium iodide.

本文言語English
ホスト出版物のタイトル2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
出版社Institute of Electrical and Electronics Engineers Inc.
ページ2084-2086
ページ数3
ISBN(電子版)9781509056057
DOI
出版ステータスPublished - 2017
イベント44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
継続期間: 2017 6 252017 6 30

出版物シリーズ

名前2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
国/地域United States
CityWashington
Period17/6/2517/6/30

ASJC Scopus subject areas

  • 再生可能エネルギー、持続可能性、環境
  • 電子工学および電気工学
  • 電子材料、光学材料、および磁性材料

フィンガープリント

「Soft X-ray irradiation effect on surface structure of CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub> perovskite in multi-film stack device」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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