Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

    研究成果: Conference contribution

    抜粋

    Soft X-ray exposure effects on CH3NH3PM3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PM3 to PbI2 due to evaporation of methylammonium iodide.

    元の言語English
    ホスト出版物のタイトル2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
    出版者Institute of Electrical and Electronics Engineers Inc.
    ページ1-4
    ページ数4
    ISBN(電子版)9781509056057
    DOI
    出版物ステータスPublished - 2018 5 25
    イベント44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
    継続期間: 2017 6 252017 6 30

    Other

    Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
    United States
    Washington
    期間17/6/2517/6/30

      フィンガープリント

    ASJC Scopus subject areas

    • Renewable Energy, Sustainability and the Environment
    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials

    これを引用

    Motoki, K., Miyazawa, Y., Kobayashi, D., Ikegami, M., Miyasaka, T., Yamamoto, T., & Hirose, K. (2018). Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device. : 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366357