Soft x-ray laser beamline for surface processing and damage studies

Masahiko Ishino*, Thanh Hung Dinh, Yuji Hosaka, Noboru Hasegawa, Kimio Yoshimura, Hiroki Yamamoto, Tadashi Hatano, Takeshi Higashiguchi, Kazuyuki Sakaue, Satoshi Ichimaru, Masatoshi Hatayama, Akira Sasaki, Masakazu Washio, Masaharu Nishikino, Yasunari Maekawa

*この研究の対応する著者

研究成果査読

抄録

We have developed a soft x-ray laser (SXRL) beamline equipped with an intensity monitor dedicated to ablation study such as surface processing and damage formation. The SXRL beam having a wavelength of 13.9 nm, pulse width of 7 ps, and pulse energy of around 200 nJ is generated from Ag plasma mediums using an oscillator-amplifier configuration. The SXRL beam is focused onto the sample surface by the Mo/Si multilayer coated spherical mirror. To get the correct irradiation energy/fluence, an intensity monitor composed of a Mo/Si multilayer beam splitter and an x-ray charge-coupled device camera has been installed in the beamline. The Mo/Si multilayer beam splitter has a large polarization dependence in the reflectivity around the incident angle of 45. However, by evaluating the relationship between reflectivity and transmittance of the beam splitter appropriately, the irradiation energy onto the sample surface can be derived from the energy acquired by the intensity monitor. This SXRL beamline is available to not only the ablation phenomena but also the performance evaluation of soft x-ray optics and resists.

本文言語English
ページ(範囲)3692-3698
ページ数7
ジャーナルApplied Optics
59
12
DOI
出版ステータスPublished - 2020 4 20

ASJC Scopus subject areas

  • 原子分子物理学および光学
  • 工学(その他)
  • 電子工学および電気工学

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