Source resolvability problem with respect to a certain subclass of f-divergence

研究成果: Conference contribution

1 引用 (Scopus)

抜粋

This paper deals with the source resolvability problem which is one of typical random number generation problems. In the literatures, the achievable rate in the source resolvability problem with respect to the variational distance as well as the Kullback-Leibler (KL) divergence have been analyzed. On the other hand, in this study we consider the problem with respect to a subclass of f-divergence. The f-divergence is a general non-negative measure between two probabilistic distributions and includes several important measures such as the variational distance, the KL divergence, the Hellinger distance and so on. Hence, it is meaningful to consider the source resolvability problem with respect to the f-divergence. We derive the general formula of the optimum achievable rate for a certain subclass of the f-divergence. Then, we reveal that it is easy to derive previous results from our general formula.

元の言語English
ホスト出版物のタイトル2019 IEEE International Symposium on Information Theory, ISIT 2019 - Proceedings
出版者Institute of Electrical and Electronics Engineers Inc.
ページ2234-2238
ページ数5
ISBN(電子版)9781538692912
DOI
出版物ステータスPublished - 2019 7
イベント2019 IEEE International Symposium on Information Theory, ISIT 2019 - Paris, France
継続期間: 2019 7 72019 7 12

出版物シリーズ

名前IEEE International Symposium on Information Theory - Proceedings
2019-July
ISSN(印刷物)2157-8095

Conference

Conference2019 IEEE International Symposium on Information Theory, ISIT 2019
France
Paris
期間19/7/719/7/12

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Information Systems
  • Modelling and Simulation
  • Applied Mathematics

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  • これを引用

    Nomura, R. (2019). Source resolvability problem with respect to a certain subclass of f-divergence. : 2019 IEEE International Symposium on Information Theory, ISIT 2019 - Proceedings (pp. 2234-2238). [8849401] (IEEE International Symposium on Information Theory - Proceedings; 巻数 2019-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2019.8849401