SPECTROSCOPIC TECHNIQUES FOR THE STUDY OF SOLID-LIQUID INTERFACES.

E. Yeager, A. Homa, B. D. Cahan, Daniel Alberto Scherson

研究成果: Conference article査読

54 被引用数 (Scopus)

抄録

Substantial progress has been made with in-situ use of optical reflectance spectroscopy and Raman spectroscopy in studies of the properties of solid-liquid interfaces and particularly metal- and semiconductor-electrolyte interfaces. Such techniques provide molecular level information concerning adsorbed species and various thin films not available from electrochemical and other measurements. Ex-situ techniques including electron and ion spectroscopies also have proved helpful in understanding the properties of solid-liquid interfaces but special techniques are necessary to minimize changes in the surface structure of the solid during the transfer between the liquid and ultrahigh vacuum environment. Some of the results obtained recently by various workers using such transfer techniques in the study of adsorption on single crystals at electrochemical interfaces are reviewed. For adsorption on some solid surfaces there is parallel behavior in the liquid and vacuum environments and comparison affords insight as to the interactions of the adsorbed species at solid-liquid interfaces.

本文言語English
ページ(範囲)628-633
ページ数6
ジャーナルJournal of vacuum science & technology
20
3
DOI
出版ステータスPublished - 1981 1 1
外部発表はい
イベントProc of the Natl Symp of the Am Vac Soc, Pt 1 - Anaheim, Calif, USA
継続期間: 1981 11 21981 11 6

ASJC Scopus subject areas

  • Engineering(all)

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