TY - JOUR
T1 - Sputtered Si surface irradiated by metal cluster complex ions such as Os3(CO)12 and Ir4(CO)12
AU - Teranishi, Yoshikazu
AU - Kondou, Kouji
AU - Fujiwara, Yukio
AU - Nonaka, Hidehiko
AU - Fujimoto, Toshiyuki
AU - Ichimura, Shingo
AU - Tomita, Misuhiro
PY - 2007/4/1
Y1 - 2007/4/1
N2 - The surface sputtering of Si using a proto-type ion gun to utilize metal cluster complexes as ion source has been investigated in detail mainly using Auger spectroscopy and atomic force microscope. The Si surface was found to be successfully sputtered with a high sputtering yield and yet resulting in a reasonably smooth surface. However, the sputtered surface roughness behavior against the incident angle of the ion beam show strong dependence to the accelerating energy of the cluster ions, which could be explained by the balance between the sputtering effect and deposition of ions themselves.
AB - The surface sputtering of Si using a proto-type ion gun to utilize metal cluster complexes as ion source has been investigated in detail mainly using Auger spectroscopy and atomic force microscope. The Si surface was found to be successfully sputtered with a high sputtering yield and yet resulting in a reasonably smooth surface. However, the sputtered surface roughness behavior against the incident angle of the ion beam show strong dependence to the accelerating energy of the cluster ions, which could be explained by the balance between the sputtering effect and deposition of ions themselves.
KW - AFM
KW - Ion cluster
KW - Roughness
KW - Sputter
UR - http://www.scopus.com/inward/record.url?scp=33947717730&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33947717730&partnerID=8YFLogxK
U2 - 10.1016/j.nimb.2007.01.268
DO - 10.1016/j.nimb.2007.01.268
M3 - Article
AN - SCOPUS:33947717730
VL - 257
SP - 670
EP - 676
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
SN - 0168-583X
IS - 1-2 SPEC. ISS.
ER -