Standard materials and metrology for nanotechnology (SMAM-2)

Shingo Ichimura, Tomizo Kurosawa, Toshiyuki Fujimoto, Hidehiko Nonaka

研究成果: Editorial

元の言語English
ジャーナルMeasurement Science and Technology
18
発行部数9
DOI
出版物ステータスPublished - 2007 9 1
外部発表Yes

ASJC Scopus subject areas

  • Instrumentation
  • Engineering (miscellaneous)
  • Applied Mathematics

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