Standard materials and metrology for nanotechnology (SMAM-2)

Shingo Ichimura^*, Tomizo Kurosawa, Toshiyuki Fujimoto, Hidehiko Nonaka

^*この研究の対応する著者

研究成果: Editorial › 査読

本文言語	English
ジャーナル	Measurement Science and Technology
巻	18
号	9
DOI	https://doi.org/10.1088/0957-0233/18/9/E01
出版ステータス	Published - 2007 9月 1
外部発表	はい

ASJC Scopus subject areas

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