The epitaxial thin films of electron-doped infinite-layer cuprate superconductor Sr1-xLaxCuO2 (SLCO; x = 0.1 ) were grown by dc magnetron sputtering, and their structural and electrical properties were systematically investigated by changing mismatch to substrate and SLCO film thickness, with a reduction annealing period under vacuum to remove the excess apex oxygen. Thin films of BaySr1-yTiO3 (BSTO) with y = 0.55 , 0.6, and 0.7, prepared on (001) (La0.18Sr0.82)(Al0.59Ta0.41)O3 substrates, were used as the epitaxial buffer layers to induce different levels of tensile strain in c -axis-oriented SLCO, while (001) LaAlO3 substrates were used for the growth of a-axis-oriented SLCO. The highest Tc value of c-axis oriented SLCO was obtained on the BSTO (y = 0.6) layers and the mismatch dependence of strain relaxation thickness was clarified. The strain in a-axis SLCO films was analyzed and controlled by changing the thickness of SLCO thin films. As a result, strong thickness dependence of superconducting properties was observed, and Tc zero was obtained in the a-axis SLCO for the first time. Based on these results, the strain effects of the SLCO film properties are discussed.
ASJC Scopus subject areas