Structural and optical properties of AgAlTe2 layers grown on sapphire substrates by closed space sublimation method

A. Uruno*, A. Usui, M. Kobayashi

*この研究の対応する著者

研究成果: Article査読

9 被引用数 (Scopus)

抄録

AgAlTe2 layers were grown on a- and c-plane sapphire substrates using a closed space sublimation method. Grown layers were confirmed to be single phase layers of AgAlTe2 by X-ray diffraction. AgAlTe2 layers were grown to have a strong preference for the (112) orientation on both kinds of substrates. The variation in the orientation of grown layers was analyzed in detail using the X-ray diffraction pole figure measurement, which revealed that the AgAlTe2 had a preferential epitaxial relationship with the c-plane sapphire substrate. The atomic arrangement between the (112) AgAlTe2 layer and sapphire substrates was compared. It was considered that the high order of the lattice arrangement symmetry probably effectively accommodated the lattice mismatch. The optical properties of the grown layer were also evaluated by transmittance measurements. The bandgap energy was found to be around 2.3eV, which was in agreement with the theoretical bandgap energy of AgAlTe2.

本文言語English
論文番号183504
ジャーナルJournal of Applied Physics
116
18
DOI
出版ステータスPublished - 2014 11 14

ASJC Scopus subject areas

  • 物理学および天文学(全般)

フィンガープリント

「Structural and optical properties of AgAlTe<sub>2</sub> layers grown on sapphire substrates by closed space sublimation method」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル