Structural study of highly ordered mesoporous silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM)

Chia Wen Wu, Yusuke Yamauchi, Tetsu Ohsuna, Kazuyuki Kuroda

    研究成果: Article

    68 引用 (Scopus)

    抄録

    We have investigated the structures of mesostructured (before calcination) and mesoporous (after calcination) silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM). Highly ordered lamellar, two-dimensional (2D) hexagonal, and three-dimensional (3D) hexagonal mesostructured/mesoporous silica thin films were synthesized by adjusting the concentration of triblock copolymer (EO20PO70EO 20; P123) used as a structure-directing agent. Direct HRSEM observation of these mesostructured/mesoporous silica thin films demonstrated that they have inherent external structures on the top surfaces: (1) the lamellar mesostructured silica film exhibits a smooth plane; (2) the 2D hexagonal mesoporous silica film exhibits curved stripes; (3) the 3D hexagonal mesoporous silica film exhibits 2D porous arrangements (e.g. 6-fold symmetry and pseudo 4-fold symmetry). The removal of P123 by calcination had no effect on the surface structure but caused an anisotropic contraction, as found from cross-sectional images. Methods for the formation of the 2D hexagonal mesoporous film affected the orientation of mesochannels. Pt replicates, electrodeposited in the mesochannels of the 2D hexagonal mesoporous silica films, exhibited new structures, i.e., S-shaped, Y-shaped, and swirling-shaped nanowires with ellipsoidal cross section. Direct HRSEM observation of the mesostructured/ mesoporous silica thin films on the top surface and cross section provides detailed information on the external and internal structures, which is significant and useful for various applications of these thin films.

    元の言語English
    ページ(範囲)3091-3098
    ページ数8
    ジャーナルJournal of Materials Chemistry
    16
    発行部数30
    DOI
    出版物ステータスPublished - 2006

    Fingerprint

    High resolution electron microscopy
    Silicon Dioxide
    Nanowires
    nanowires
    Silica
    silicon dioxide
    Thin films
    Scanning electron microscopy
    scanning electron microscopy
    high resolution
    thin films
    Calcination
    roasting
    swirling
    cross sections
    symmetry
    Surface structure
    Block copolymers
    contraction
    copolymers

    ASJC Scopus subject areas

    • Physical and Theoretical Chemistry
    • Materials Chemistry
    • Materials Science(all)

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    @article{c8243592dfc64fe6bb4fc1113d644c04,
    title = "Structural study of highly ordered mesoporous silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM)",
    abstract = "We have investigated the structures of mesostructured (before calcination) and mesoporous (after calcination) silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM). Highly ordered lamellar, two-dimensional (2D) hexagonal, and three-dimensional (3D) hexagonal mesostructured/mesoporous silica thin films were synthesized by adjusting the concentration of triblock copolymer (EO20PO70EO 20; P123) used as a structure-directing agent. Direct HRSEM observation of these mesostructured/mesoporous silica thin films demonstrated that they have inherent external structures on the top surfaces: (1) the lamellar mesostructured silica film exhibits a smooth plane; (2) the 2D hexagonal mesoporous silica film exhibits curved stripes; (3) the 3D hexagonal mesoporous silica film exhibits 2D porous arrangements (e.g. 6-fold symmetry and pseudo 4-fold symmetry). The removal of P123 by calcination had no effect on the surface structure but caused an anisotropic contraction, as found from cross-sectional images. Methods for the formation of the 2D hexagonal mesoporous film affected the orientation of mesochannels. Pt replicates, electrodeposited in the mesochannels of the 2D hexagonal mesoporous silica films, exhibited new structures, i.e., S-shaped, Y-shaped, and swirling-shaped nanowires with ellipsoidal cross section. Direct HRSEM observation of the mesostructured/ mesoporous silica thin films on the top surface and cross section provides detailed information on the external and internal structures, which is significant and useful for various applications of these thin films.",
    author = "Wu, {Chia Wen} and Yusuke Yamauchi and Tetsu Ohsuna and Kazuyuki Kuroda",
    year = "2006",
    doi = "10.1039/b604062d",
    language = "English",
    volume = "16",
    pages = "3091--3098",
    journal = "Journal of Materials Chemistry",
    issn = "0959-9428",
    publisher = "Royal Society of Chemistry",
    number = "30",

    }

    TY - JOUR

    T1 - Structural study of highly ordered mesoporous silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM)

    AU - Wu, Chia Wen

    AU - Yamauchi, Yusuke

    AU - Ohsuna, Tetsu

    AU - Kuroda, Kazuyuki

    PY - 2006

    Y1 - 2006

    N2 - We have investigated the structures of mesostructured (before calcination) and mesoporous (after calcination) silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM). Highly ordered lamellar, two-dimensional (2D) hexagonal, and three-dimensional (3D) hexagonal mesostructured/mesoporous silica thin films were synthesized by adjusting the concentration of triblock copolymer (EO20PO70EO 20; P123) used as a structure-directing agent. Direct HRSEM observation of these mesostructured/mesoporous silica thin films demonstrated that they have inherent external structures on the top surfaces: (1) the lamellar mesostructured silica film exhibits a smooth plane; (2) the 2D hexagonal mesoporous silica film exhibits curved stripes; (3) the 3D hexagonal mesoporous silica film exhibits 2D porous arrangements (e.g. 6-fold symmetry and pseudo 4-fold symmetry). The removal of P123 by calcination had no effect on the surface structure but caused an anisotropic contraction, as found from cross-sectional images. Methods for the formation of the 2D hexagonal mesoporous film affected the orientation of mesochannels. Pt replicates, electrodeposited in the mesochannels of the 2D hexagonal mesoporous silica films, exhibited new structures, i.e., S-shaped, Y-shaped, and swirling-shaped nanowires with ellipsoidal cross section. Direct HRSEM observation of the mesostructured/ mesoporous silica thin films on the top surface and cross section provides detailed information on the external and internal structures, which is significant and useful for various applications of these thin films.

    AB - We have investigated the structures of mesostructured (before calcination) and mesoporous (after calcination) silica thin films and replicated Pt nanowires by high-resolution scanning electron microscopy (HRSEM). Highly ordered lamellar, two-dimensional (2D) hexagonal, and three-dimensional (3D) hexagonal mesostructured/mesoporous silica thin films were synthesized by adjusting the concentration of triblock copolymer (EO20PO70EO 20; P123) used as a structure-directing agent. Direct HRSEM observation of these mesostructured/mesoporous silica thin films demonstrated that they have inherent external structures on the top surfaces: (1) the lamellar mesostructured silica film exhibits a smooth plane; (2) the 2D hexagonal mesoporous silica film exhibits curved stripes; (3) the 3D hexagonal mesoporous silica film exhibits 2D porous arrangements (e.g. 6-fold symmetry and pseudo 4-fold symmetry). The removal of P123 by calcination had no effect on the surface structure but caused an anisotropic contraction, as found from cross-sectional images. Methods for the formation of the 2D hexagonal mesoporous film affected the orientation of mesochannels. Pt replicates, electrodeposited in the mesochannels of the 2D hexagonal mesoporous silica films, exhibited new structures, i.e., S-shaped, Y-shaped, and swirling-shaped nanowires with ellipsoidal cross section. Direct HRSEM observation of the mesostructured/ mesoporous silica thin films on the top surface and cross section provides detailed information on the external and internal structures, which is significant and useful for various applications of these thin films.

    UR - http://www.scopus.com/inward/record.url?scp=33746372958&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=33746372958&partnerID=8YFLogxK

    U2 - 10.1039/b604062d

    DO - 10.1039/b604062d

    M3 - Article

    VL - 16

    SP - 3091

    EP - 3098

    JO - Journal of Materials Chemistry

    JF - Journal of Materials Chemistry

    SN - 0959-9428

    IS - 30

    ER -